Jericho, VT, United States of America

Donald L LaCroix


Average Co-Inventor Count = 6.0

ph-index = 2

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 2005-2016

where 'Filed Patents' based on already Granted Patents

3 patents (USPTO):

Title: **Innovator Spotlight: Donald L LaCroix**

Introduction

Donald L LaCroix, hailing from Jericho, VT (US), is a noteworthy inventor with a total of three patents to his name. His work predominantly focuses on innovative methodologies for testing integrated circuits, showcasing his expertise in the field of electronics and engineering.

Latest Patents

Among his recent contributions, LaCroix's patent titled "Real-time rule engine for adaptive testing of integrated circuits" stands out. This invention details a sophisticated method of testing devices through an adaptive testing engine. It allows for the collection of test data, which is then utilized to formulate an adaptation command, enhancing the testing process's efficiency. This command is communicated to a tool control application that effectively manages operations pertinent to the device's testing.

Career Highlights

Donald L LaCroix is currently employed at International Business Machines Corporation (IBM), a leading technology company known for its innovations in computing and information technology. His role within the company has allowed him to contribute significantly to advancements in device testing methodologies.

Collaborations

LaCroix works alongside esteemed colleagues such as Randolph P Steel and David E Atkinson. Their collaborative efforts have likely played a crucial role in the development and success of LaCroix's patented inventions, fostering an environment of innovation and excellence.

Conclusion

With a solid foundation in electronics and a commitment to enhancing testing processes, Donald L LaCroix exemplifies the spirit of innovation. His work at IBM and the patents he has secured reflect his dedication to advancing technology and improving the efficiency of integrated circuit testing.

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