International Business Machines Corporation

Donald L LaCroix

Randolph P Steel

Matthew Sean Grady

David B Lutton, Ii

Bradley D Pepper

David E Atkinson

Douglas E Sprague

Sally S Botala

Dale B Grosch

Anthony K Stevens

A method of testing a device is disclosed. Test data is obtained for a device testing program that tests the device. An adaptation command for testing the device is determined at an adaptive testing engine using obtained test data. The adaptation command is sent from the adaptive testing engine to a tool control application. The tool control application uses the adaptation command to control an operation related to the testing of the device.

Real-time rule engine for adaptive testing of integrated circuits

A method, system and software for automatically generating a test environment for testing a plurality of devices (DUTs) under test in a test system. The multiple devices are tested by mapping the plurality of DUTs into pins of the tester system to create pin data; inputting into a test program generator pattern data, generic test program rules and the pin data; generating a multi-DUT test program and multi-DUT pattern data; and controlling the test system through the test program. The resulting fail data is then logged to each DUT.

Automated multi-device test process and system

Growing community of inventors

Jericho, VT, United States of America

Donald L LaCroix