The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2005
Filed:
Oct. 26, 2000
Sally S. Botala, Colchester, VT (US);
Dale B. Grosch, Burlington, VT (US);
Donald L. Lacroix, Jericho, VT (US);
Douglas E. Sprague, Jericho, VT (US);
Randolph P. Steel, Essex Junction, VT (US);
Anthony K. Stevens, Underhill, VT (US);
Sally S. Botala, Colchester, VT (US);
Dale B. Grosch, Burlington, VT (US);
Donald L. LaCroix, Jericho, VT (US);
Douglas E. Sprague, Jericho, VT (US);
Randolph P. Steel, Essex Junction, VT (US);
Anthony K. Stevens, Underhill, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, system and software for automatically generating a test environment for testing a plurality of devices (DUTs) under test in a test system. The multiple devices are tested by mapping the plurality of DUTs into pins of the tester system to create pin data; inputting into a test program generator pattern data, generic test program rules and the pin data; generating a multi-DUT test program and multi-DUT pattern data; and controlling the test system through the test program. The resulting fail data is then logged to each DUT.