Wisconsin Rapids, WI, United States of America

Donald J Gunderson

This inventor holds 1 USPTO granted patent. Top assignee: Consolidated Papers, Inc.. Active years: 1983.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Donald J Gunderson. Retrieved from https://idiyas.com/inventor/donald-j-gunderson

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 1983

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1 patent (USPTO):Explore Patents

Title: The Innovations of Donald J Gunderson

Introduction

Donald J Gunderson is an accomplished inventor based in Wisconsin Rapids, WI (US). He is known for his innovative contributions to the field of material measurement, particularly in the area of opacity measurement for sheet materials such as paper. His work has significantly advanced the methods used in this industry.

Latest Patents

Gunderson holds a patent for a "Method and apparatus for measuring the opacity of sheet material." This invention involves directing a beam of light against the material and sensing the intensity of light that passes through it. The data is then converted into a visual readout. By taking multiple opacity measurements at different areas on the sheet, the invention allows for a quick and convenient average readout of the measurements. This technique is notably less complicated and time-consuming compared to traditional methods that rely on contrast ratios.

Career Highlights

Throughout his career, Gunderson has made significant strides in the field of material measurement. His work at Consolidated Papers, Inc. has been instrumental in developing more efficient methods for assessing the quality of paper products. His innovative approach has not only improved accuracy but also streamlined the measurement process.

Collaborations

Gunderson has collaborated with notable coworkers such as William A Arndt and Wayne A Damrau. Their combined expertise has contributed to the success of various projects within the company.

Conclusion

Donald J Gunderson's contributions to the field of opacity measurement have made a lasting impact on the industry. His innovative methods continue to influence how materials are assessed for quality and performance.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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