The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 1983

Filed:

Dec. 29, 1980
Applicant:
Inventors:

William A Arndt, Wisconsin Rapids, WI (US);

Wayne A Damrau, Wisconsin Rapids, WI (US);

Donald J Gunderson, Wisconsin Rapids, WI (US);

Assignee:

Consolidated Papers, Inc., Wisconsin Rapids, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356432 ;
Abstract

To measure the opacity of sheet material, such as paper, a beam of light is directed against the material and the intensity of any light passing through the material is sensed and converted to a visual readout. A plurality of opacity measurements are made at different areas on the sheet material and, when a selected number of measurements have been made, a readout of the average value of the measurements is generated. The particular technique enables a large number of opacity measurements to be quickly and conveniently made and averaged, and is considerably less complicated and time consuming than opacity measurements which are conventionally made as a function of contrast ratios.


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