Don G Craven

Title: Don G Craven: Innovator in Circuit Testing Technologies

Introduction

Don G Craven is a notable inventor based in Maple Valley, WA (US). He has made significant contributions to the field of circuit testing, holding 2 patents that showcase his innovative approach to technology. His work primarily focuses on methods and apparatuses that enhance the efficiency and effectiveness of testing processes in electronic systems.

Latest Patents

Craven's latest patents include a "Method and apparatus for implementing a register scan process." This invention outlines a method that involves receiving expected values of a configuration, comparing these values with those in a configuration database, and reporting the results of this comparison. Another significant patent is "Zero connection for on-chip testing," which describes a system for connecting to a test bus on a printed circuit board. This system utilizes a regular pattern of contact points that are coupled to the circuits being tested, allowing for effective testing through spring-loaded contacts connected to test equipment.

Career Highlights

Don G Craven is currently employed at Intel Corporation, where he continues to develop innovative solutions in the field of electronics. His work at Intel has positioned him as a key player in advancing testing technologies that are crucial for the reliability of electronic devices.

Collaborations

Throughout his career, Craven has collaborated with esteemed colleagues such as William J Chalmers and Joseph A Schaefer. These collaborations have further enriched his work and contributed to the development of cutting-edge technologies in circuit testing.

Conclusion

Don G Craven's contributions to the field of circuit testing through his patents and work at Intel Corporation highlight his role as an influential inventor. His innovative methods continue to shape the future of electronic testing technologies.