Company Filing History:
Years Active: 2006
Title: **Inventor Don Brayton: Innovations in Calibration Standards**
Introduction
Don Brayton, an inventive mind based in Sunland, California, has made notable contributions to the field of calibration standards within inspection systems. With a focus on precision and accuracy, his work emphasizes the importance of reliable measurement techniques in technological applications.
Latest Patents
Brayton holds a patent for "Methods for forming a calibration standard and calibration standards for inspection systems." This innovative method involves the use of optical systems to scan both a first and second specimen. The technique entails depositing master standard particles that are traceable to national or international authorities, as well as product standard particles onto the specimens. The method allows for the determination of the lateral dimension of the product standard particles through comparative scanning analysis, achieving high precision with lateral dimensions of less than about 100 nm and an uncertainty of less than 2%. This standard is tailored to meet the stringent requirements of the 130 nm technology generation in semiconductor devices.
Career Highlights
Brayton is associated with KLA-Tencor Technologies Corporation, a leading company in the development of advanced inspection and metrology solutions for semiconductor manufacturing. His career is marked by a commitment to enhancing measurement accuracy and supporting the evolution of semiconductor technology, thereby paving the way for high-performance electronic devices.
Collaborations
At KLA-Tencor Technologies Corporation, Brayton collaborates with talented professionals including Ian R. Smith and Christian Wolters. Together, they work towards advancing the frontiers of inspection systems and ensuring that the calibration standards they develop meet industry demands.
Conclusion
Don Brayton stands out as an influential inventor in the realm of calibration standards, making significant strides in ensuring the reliability of inspection systems. His patented methods and collaboration with esteemed colleagues reflect his dedication to innovation in semiconductor technology, ultimately contributing to the trustworthiness of measurements in the industry.