Zurich, Switzerland

Dominik Loosli

This inventor holds 1 USPTO granted patent and 2 EPO patents. Top assignee: General Electric Technology Gmbh. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dominik Loosli. Retrieved from https://idiyas.com/inventor/dominik-loosli

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Dominik Loosli: Innovator in Inspection Technology

Introduction

Dominik Loosli is a notable inventor based in Zurich, Switzerland. He has made significant contributions to the field of inspection technology, particularly through his innovative patent.

Latest Patents

Loosli holds a patent for an inspection probe, which is an advanced inspection apparatus. This apparatus includes an extendable structure, an inspection probe, a drive, a sensor, and a processor. The extendable structure is designed to maintain physical contact with a first surface while transitioning across it. The drive positions the inspection probe, while the sensor measures the drive load over time. The processor analyzes the drive load signal to determine the operating condition of the extendable structure.

Career Highlights

Dominik Loosli is currently employed at General Electric Technology GmbH, where he continues to develop innovative solutions in inspection technology. His work has been instrumental in enhancing the efficiency and accuracy of inspection processes.

Collaborations

Loosli collaborates with talented professionals such as Reinhard Fischer and Andrew Lumley, contributing to a dynamic and innovative work environment.

Conclusion

Dominik Loosli's contributions to inspection technology through his patent demonstrate his commitment to innovation and excellence in his field. His work at General Electric Technology GmbH continues to pave the way for advancements in inspection methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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