General Electric Technology Gmbh

Ansaldo Energia IP UK Limited

Dominik Loosli

Andrew Lumley

Reinhard Fischer

Thomas Schneider

Thomas Morris

Christoph Huerzeler

Andres Peralta

Wolfgang Fischer

Elena Otero Del Real

An inspection apparatus, including an extendable structure, an inspection probe, a drive, a sensor, and a processor. The extendable structure includes an end fixed to the inspection probe and insertable into a gap defined between a first surface and a second surface. The extendable structure is configured to maintain physical contact with the first surface as the end transitions across the first surface. The drive is configured to position the inspection probe. The current sensor is coupled to the drive and configured to measure a drive load over a period of time the inspection probe transitions across the first surface. The processor is coupled to the sensor and is configured to receive a signal associated with the drive load corresponding to movement of the inspection probe, and determine an operating condition of the extendable structure based on the drive load signal.

Inspection probe

Growing community of inventors

Zurich, Switzerland

Dominik Loosli