This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignees: Industry-University Cooperation Foundation Hanyang University, Samsung Electronics Ltd.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
1 out of 1,237 
1 out of 6,229 Years Active: 2026
Title: Dokyung Jeong - Innovator in Fluorescence Microscopy Metrology
Introduction
Dokyung Jeong is an inventor based in Seoul, South Korea. He has made significant contributions to the field of fluorescence microscopy. His innovative work focuses on developing advanced metrology systems that enhance the capabilities of fluorescence microscopy.
Latest Patent Applications
Dokyung Jeong has filed a patent application for a "Fluorescence Microscopy Metrology System and Method of Operating Fluorescence Microscopy Metrology System." This application describes a fluorescence microscopy metrology system that includes an optical system designed to generate first light and second light with different wavelengths. The system features a microscope body that irradiates a sample coated with a fluorescent material using the first and second light. It also includes an image detection device that captures a fluorescence image corresponding to the received fluorescence. Additionally, a nanostructure analysis device is incorporated to measure line edge roughness (LER) from the detected fluorescence image, analyze power spectral density (PSD), or detect nanoparticle defects.
Conclusion
Dokyung Jeong's work in fluorescence microscopy metrology represents a significant advancement in the field. His innovative approach has the potential to improve the accuracy and efficiency of fluorescence microscopy applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile