Milpitas, CA, United States of America

Diwakar Agarwal

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Apple Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Diwakar Agarwal. Retrieved from https://idiyas.com/inventor/diwakar-agarwal-hvrnt9nv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Diwakar Agarwal: Inventor in Communication Circuit Design

Introduction

Diwakar Agarwal is an inventor associated with Milpitas, California, and Apple Inc. His work includes a patent for a double-pumped communications channel that uses a double-edge-triggered flip-flop with scan functionality.

Latest Patents

Agarwal is credited with 1 patent: “Double-pumped communication channel using double edge-triggered flip-flop with scan functionality.” The invention describes a flip-flop with two latches that capture bits on opposite edges of a clock signal. A shadow latch supports test operation, while the circuit relays data on alternating clock edges during normal operation and test data on the opposite edge during test mode. Multiple such flip-flops can be connected in series to form a communications channel.

Career Highlights

Agarwal’s patent focuses on circuit architecture for high-speed communication and testing. The design combines double-edge-triggered data handling with scan functionality, enabling the circuit to support both operational and test modes.

Collaborations

Agarwal is associated with Apple Inc. His listed coworker is Supreet Jeloka.

Conclusion

Diwakar Agarwal’s patented design brings together double-edge-triggered data transfer and scan testing in a communications channel, reflecting his contribution to communication circuit technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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