Company Filing History:
Years Active: 2008-2025
Title: Dirk Schäfer: Innovator in X-ray Tomography
Introduction
Dirk Schäfer is a prominent inventor based in Hamburg, Germany. He has made significant contributions to the field of X-ray tomography, holding a total of 16 patents. His work focuses on improving imaging techniques, particularly in medical applications.
Latest Patents
One of his latest patents is titled "Redundancy-weighted image reconstruction for short-scan X-ray tomography with an off-center X-ray detector." This invention addresses the challenges of off-center detector X-ray tomography by utilizing projection data acquired during a rotation of an X-ray source and an off-center detector. The method involves redundancy weighting of the projection data to enhance image quality. Another notable patent is "Scaled radiography reconstruction," which presents a solution to artifacts that can occur during 3D X-ray or proton radiography reconstruction. This invention aims to mitigate issues arising from inconsistencies in redundant projections.
Career Highlights
Throughout his career, Dirk Schäfer has worked with notable companies such as Koninklijke Philips Corporation N.V. and Ion Beam Applications S.A. His experience in these organizations has allowed him to develop and refine his innovative techniques in imaging technology.
Collaborations
Dirk has collaborated with esteemed colleagues, including Michael Grass and Eberhard Sebastian Hansis. These partnerships have contributed to the advancement of his research and the successful development of his patents.
Conclusion
Dirk Schäfer's contributions to X-ray tomography and imaging technology have established him as a key figure in the field. His innovative patents and collaborations reflect his commitment to advancing medical imaging techniques.