The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2022
Filed:
Dec. 19, 2017
Koninklijke Philips N.v., Eindhoven, NL;
Ion Beam Applications S.a., Louvain-la-Neuve, BE;
Dirk Schäfer, Hamburg, DE;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
ION BEAM APPLICATIONS S.A., Louvain-la-Neuve, BE;
Abstract
The invention relates to off-center detector X-ray tomography reconstruction of an image of an object on the basis of projection data acquired during a rotation of an X-ray source and the off-center detector around the object in two rotational passes of less than 360°, wherein a focus point of the X-ray beam travels along largely overlapping arcs () in the two rotational passes, the off-center detector being positioned asymmetrically with respect to a central of the X-ray beam and a direction of a detector offset being reversed between the passes. According to the invention, redundancy weighting of the projection data with respect to a redundant acquisition of projection values during each of the rotational passes is made using a redundancy weighting function determined on the basis of a union of the arcs ().