The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2021
Filed:
Dec. 20, 2017
Applicants:
Koninklijke Philips N.v., Eindhoven, NL;
Ion Beam Applications S.a., Louvain-la-Neuve, BE;
Inventors:
Dirk Schäfer, Hamburg, DE;
Peter George Van De Haar, Eindhoven, NL;
Sebastien Brousmiche, Fouvain-la-Neuve, BE;
Assignee:
KONINKLIJKE PHILIPS N. V., Eindhoven, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 11/00 (2006.01); A61B 6/03 (2006.01); A61B 6/00 (2006.01); G06T 3/40 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 11/005 (2013.01); A61B 6/032 (2013.01); A61B 6/4258 (2013.01); A61B 6/5241 (2013.01); A61B 6/585 (2013.01); G06T 3/40 (2013.01); G06T 7/0012 (2013.01); G06T 2207/10116 (2013.01);
Abstract
The invention relates to off-center detector 3D X-ray or proton radiography reconstruction. Redundancy weighting with a steep weighting function around the iso-axis typically leads to artifacts in the reconstruction, for example, if inconsistencies between two nominal redundant projections occur, e.g. due to slightly incorrect detector calibration or scatter correction, etc. With the present invention, an approach is presented for overcoming or mitigating these problems.