Aartselaar, Belgium

Dirk E Van Dijck

This inventor holds 2 USPTO granted patents. Top assignee: U.S. Philips Corporation. Active years: 1992-1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dirk E Van Dijck. Retrieved from https://idiyas.com/inventor/dirk-e-van-dijck

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.3

ph-index = 2

Forward Citations = 25(Granted Patents)


Company Filing History:


Years Active: 1992-1993

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2 patents (USPTO):Explore Patents

Title: Dirk E Van Dijck: Innovator in Electron Microscopy

Introduction

Dirk E Van Dijck is a notable inventor based in Aartselaar, Belgium. He has made significant contributions to the field of electron microscopy, holding 2 patents that showcase his innovative approaches to enhancing imaging techniques.

Latest Patents

His latest patents include a "Method for autotuning of an electron microscope" and a "Method of directly deriving amplitude and phase information of an object." The first patent describes a method of autotuning an electron microscope by producing a series of images of the object to be examined. This involves using a defined tilt of the electron beam in different directions for each respective image, resulting in images that are displaced relative to one another. Each image is decomposed into linear and non-linear components, with linear components separated by Fourier filtering. The relative displacements of these components are measured to derive autotuning parameters for the electron microscope.

The second patent details a high-resolution electron microscope that includes a detection system and an image processing system. This microscope is designed to derive amplitude and phase information of an object in the form of an electron wave function. A series of images is recorded with slightly differing defocus values, creating a quasi-three-dimensional image area. A quasi-three-dimensional Fourier transformation is then performed to separate linear and non-linear image information for reconstructing the electron wave function.

Career Highlights

Dirk E Van Dijck has been associated with U.S. Philips Corporation, where he has applied his expertise in electron microscopy to advance the technology further. His work has been instrumental in improving the capabilities of electron microscopes, making them more effective for research and industrial applications.

Collaborations

He has collaborated with notable individuals in his field, including Alan F De Jong, to enhance the research and development of electron microscopy technologies.

Conclusion

Dirk E Van Dijck's contributions to electron microscopy through his innovative patents and collaborations have significantly impacted the field. His work continues to inspire advancements in imaging technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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