Dima Hammed

Title: Dima Hammed: Innovator in Receiver Testing Techniques

Introduction

Dima Hammed is a notable inventor based in Jerusalem, Israel. He has made significant contributions to the field of receiver operation testing. His innovative techniques are aimed at enhancing the performance and reliability of integrated circuits (ICs).

Latest Patents

Dima Hammed holds a patent for "Techniques for testing receiver operation." This patent encompasses various embodiments directed towards methods for testing a receiver incorporated into an IC to receive a bitstream. The apparatus described includes a precharge component that sets a variable gain amplifier (VGA) to output a differential bias voltage. Additionally, it features a taps component that establishes a feedback loop from the output of the bit slicer to its input through a delay circuit. This setup allows for the inversion of polarity of a sum of differential voltages, enabling oscillation of the bit slicer. The capture component is designed to capture a series of bit values from the output of the bit slicer.

Career Highlights

Dima Hammed is currently employed at Intel Corporation, where he continues to innovate and develop advanced technologies. His work focuses on improving the efficiency and functionality of receiver systems within integrated circuits.

Collaborations

Dima collaborates with talented colleagues, including Elior Segev and Kevan A Lillie. Their combined expertise contributes to the advancement of technology in their field.

Conclusion

Dima Hammed is a prominent inventor whose work in receiver testing techniques has the potential to significantly impact the field of integrated circuits. His contributions at Intel Corporation and his innovative patent demonstrate his commitment to advancing technology.