This inventor holds 1 USPTO granted patent. Top assignee: Innerspec Technologies, Inc. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Dileep Koodalil: Guided-Wave Inspection Innovation
Introduction
Dileep Koodalil is an inventor based in Torrejón de Ardoz, Spain, whose patent work addresses the inspection of solid structures for defects. His invention combines fixed-wavelength and variable-wavelength guided-wave measurements to help estimate defect size and geometry.
Latest Patents
Koodalil is associated with 1 patent: “Defect Sizing Combining Fixed Wavelength and Variable Wavelength Guided Waves.” The patent describes a system and method for sizing defects in solid structures using guided waves.
The system uses a magnetostrictive-strip electromagnetic acoustic transducer (EMAT). It includes a static biasing magnetic field, an RF coil for fixed-wavelength measurements, an RF coil for variable-wavelength measurements, and a strip of highly magnetostrictive material coupled to the structure being inspected.
The fixed-wavelength coil measures the amplitude and frequency content of signals reflected from or attenuated within the structure. These measurements help estimate the size and geometry of defects. The variable-wavelength coil records which frequencies are cut off or pass through the structure, providing another basis for estimating defect size. The fixed-wavelength assessment also helps determine whether the variable-wavelength estimate is valid, and the final assessment can rely on either estimate or combine both.
Career Highlights
Koodalil’s listed patent work focuses on guided-wave inspection technology and defect assessment. He is associated with Innerspec Technologies, Inc., a company working in the field of nondestructive testing.
Collaborations
The provided information identifies Borja Lopez Jauregui and Alvaro Pallares as Koodalil’s coworkers. Their names are included here as professional associations; no specific roles in the patent are stated.
Conclusion
Dileep Koodalil’s patent combines complementary guided-wave measurement techniques to support more informed defect sizing in solid structures.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile