The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2026
Filed:
Oct. 13, 2022
Innerspec Technologies, Inc., Forest, VA (US);
Borja Lopez Jauregui, Lynchburg, VA (US);
Dileep Koodalil, Torrejon de Ardoz, ES;
Alvaro Pallares, Torres de la Alameda, ES;
Syed Ali, Lynchburg, VA (US);
Innerspec Technologies Inc., Forest, VA (US);
Abstract
A system and method for sizing defects in solid structures using guided waves. The system includes a magnetostrictive-strip EMAT transducer comprising at least one biasing static magnetic field, at least one RF coil for fixed-wavelength measurements, at least one RF coil for variable-wavelength measurements, and a strip of highly magnetostrictive material that is coupled with the structure. The fixed-wavelength RF coil permits obtaining measurements of amplitude and frequency content of signals reflected and/or attenuated when traveling through the structure which are used to estimate the size and geometry of any defects in this structure. The variable-wavelength RF coil permits recording the frequencies that are cut off or pass through the structure to also estimate the size of any defects in the structure. The fixed-wavelength sizing and geometry assessment is used to determine whether the variable-wavelength estimate is valid. The final assessment is based on the fixed-wavelength estimate, the variable-wavelength estimate, or a combination of both.