San Jose, CA, United States of America

Dietrich Gage


 

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Dietrich Gage

Introduction

Dietrich Gage, an inventive professional based in San Jose, CA, has made significant strides in the realm of temperature measurement technology. With a novel approach to calibrating temperature control in processing chambers, Gage’s work is poised to enhance the efficiency of various industrial processes.

Latest Patents

Gage holds a patent for a "Non-contact temperature calibration tool for a substrate support and method of using the same." This invention centers around a method and tool designed to measure temperature and calibrate the temperature control of substrate supports without direct contact. The patent outlines a unique test fixture that allows for temperature calibration, enhancing the accuracy and reliability of processes within a processing chamber.

Career Highlights

Throughout his career, Dietrich Gage has been affiliated with Applied Materials, Inc., where he has contributed his expertise to develop innovative technological solutions. His singular patent exemplifies his commitment to improving thermal measurement techniques, a critical aspect in the semiconductor and material processing industries.

Collaborations

Gage collaborates with notable coworkers like Niraj Merchant and Lara Hawrylchak, enriching the development process with combined knowledge and expertise. Their teamwork fosters an environment conducive to groundbreaking innovations, further solidifying their contributions in the high-tech field.

Conclusion

In summary, Dietrich Gage stands out as an inventor who is shaping the landscape of temperature calibration technology. His patent reflects a significant advancement, showcasing his innovative spirit within the realms of engineering and technology at Applied Materials, Inc. Gage's work continues to inspire further innovations and improves reliability in critical processing applications.

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