Dieter Winkler

Title: Dieter Winkler: Innovator in Charged Particle Beam Technology

Introduction

Dieter Winkler is a notable inventor based in Poing, Germany. He has made significant contributions to the field of charged particle beam technology, particularly through his innovative patent. His work has implications for various applications, including material inspection and analysis.

Latest Patents

Dieter Winkler holds a patent for a "Method for inspecting a specimen and charged particle beam device." This invention describes a charged particle beam device designed for irradiating or inspecting a specimen. The device includes a charged particle beam source that generates a primary charged particle beam and a multi-aperture lens plate with multiple apertures for forming four or more primary beamlets. Additionally, it features two or more electrodes, each with an opening for the primary charged particle beam or the four or more primary beamlets. The device also incorporates a collimator for deflecting the primary beamlets and an objective lens unit with three or more electrodes, each having openings for the primary beamlets.

Career Highlights

Throughout his career, Dieter Winkler has worked with prominent organizations, including Applied Materials Israel Limited and Technische Universiteit Delft. His experience in these institutions has allowed him to refine his expertise in charged particle beam technology and contribute to advancements in the field.

Collaborations

Dieter has collaborated with notable professionals such as Pieter Kruit and Ron Naftali. These collaborations have further enriched his work and have led to significant developments in charged particle beam applications.

Conclusion

Dieter Winkler's contributions to charged particle beam technology through his innovative patent and collaborations with esteemed colleagues highlight his role as a key figure in this field. His work continues to influence advancements in material inspection and analysis.