Mandelieu la Napoule, France

Didier Miras

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Thales. Active years: 2015.


% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Innovations by Didier Miras in Metrology Systems

Introduction

Didier Miras is an accomplished inventor based in Mandelieu la Napoule, France. He has made significant contributions to the field of metrology, particularly in the area of Fourier transform interferometry. His innovative work focuses on improving the precision of devices used for remotely analyzing gaseous compounds.

Latest Patents

Didier Miras holds a patent for a "Metrology system and method applied to an interferometer for remotely analysing a gaseous compound." This invention enhances the capabilities of Fourier transform interferometers by incorporating at least one movable retroreflector and a metrology subsystem that utilizes at least three laser beams. The metrology unit generates a signal for each sounding point represented by a pixel on the capture matrix, which incorporates the displacements in space of the movable elements. This advancement is crucial for accurate remote analysis of gaseous compounds.

Career Highlights

Didier Miras is currently associated with Thales, a leading company in advanced technology solutions. His work at Thales has allowed him to apply his expertise in metrology and interferometry, contributing to various projects that require high precision in measurements.

Collaborations

Didier collaborates with Jean-Michel Gaucel, a fellow professional in the field. Their partnership enhances the innovative efforts within their projects, leading to advancements in metrology systems.

Conclusion

Didier Miras is a notable inventor whose work in metrology systems has significantly impacted the field of Fourier transform interferometry. His patent demonstrates a commitment to enhancing precision in remote analysis of gaseous compounds. His contributions continue to influence advancements in technology and measurement systems.

Profile summary based on public USPTO records.
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