The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2015
Filed:
Mar. 15, 2012
Applicants:
Jean-michel Gaucel, Mandelieu la Napoule, FR;
Didier Miras, Mandelieu la Napoule, FR;
Inventors:
Jean-Michel Gaucel, Mandelieu la Napoule, FR;
Didier Miras, Mandelieu la Napoule, FR;
Assignee:
Thales, Neuilly sur Seine, FR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/45 (2006.01); G01J 3/453 (2006.01); G01N 21/3504 (2014.01); G01N 21/17 (2006.01); G01N 21/35 (2014.01);
U.S. Cl.
CPC ...
G01J 3/4535 (2013.01); G01N 21/3504 (2013.01); G01N 2021/1795 (2013.01); G01N 2021/3595 (2013.01);
Abstract
In the field of Fourier transform interferometry and in particular a device and a method for improving the precision of such a device for remotely analyzing a gaseous compound, a Fourier transform interferometer includes: at least one movable retroreflector; a metrology subsystem using at least three laser beams; and a metrology unit generating, for each sounding point represented by a pixel on the capture matrix imaging a gaseous compound, a metrology signal incorporating the displacements in space of the movable element(s).