This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Agence Nationale De Valorisation De La Recherche. Active years: 1989.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1989
Title: The Innovative Contributions of Didier Leclercq
Introduction
Didier Leclercq is a notable inventor based in Lille, France. He has made significant contributions to the field of measurement technology, particularly in the development of devices that measure radiative and convective fluxes. His innovative approach has led to the creation of a unique patent that showcases his expertise and creativity.
Latest Patents
Didier Leclercq holds a patent for a "Device for measuring the intensity of a radiative flux." This device is designed to measure the intensity of both radiative and convective fluxes. It features a thin support made from insulating material and a continuous strip of meandering shape made from a first conducting material. The device also includes a series of discontinuous deposits made from a second conducting material, which has a different thermoelectric power than the first material. The combination of these elements forms an elementary thermocouple, allowing for precise measurements. The device may also include a heat conducting layer, enhancing its functionality.
Career Highlights
Throughout his career, Didier Leclercq has worked with esteemed organizations such as the Agence Nationale de Valorisation de la Recherche and the Université Lille I Sciences et Technologies. His experience in these institutions has contributed to his development as an inventor and researcher.
Collaborations
Didier has collaborated with notable colleagues, including Pierre Thery and Philippe Herin. These partnerships have likely enriched his work and expanded the impact of his inventions.
Conclusion
Didier Leclercq's contributions to measurement technology through his innovative patent demonstrate his expertise and commitment to advancing the field. His work continues to influence the way we understand and measure radiative and convective fluxes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile