The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 1989

Filed:

May. 14, 1987
Applicant:
Inventors:

Pierre Thery, Villeneuve D'Ascq, FR;

Didier Leclercq, Lille, FR;

Philippe Herin, Maubeuge, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K / ; G01K / ;
U.S. Cl.
CPC ...
374 30 ; 374 29 ; 374122 ; 136225 ;
Abstract

A device is provided for measuring the intensity of a radiative flux and optionally also a convective flux, including a thin support made from an insulating material; a thin continuous strip of meandering shape made from a first conducting material; a series of discontinuous deposits made from a second conducting material having a thermoelectric power different from that of the first material and a high electric conductivity, the whole of the deposits and of the associated underlying strip portion forming an elementary thermocouple and having, in the transverse direction with respect to the direction of extension of the strip, a width which varies between its two ends, the variation in width being in the same direction for the successive deposits along the strip; and a coating with high emissivity intimately covering at least the successive deposits. The device may also include a heat conducting layer.


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