Qingdao, China

Deyan Liu

This inventor holds 1 USPTO granted patent. Top assignees: Cosmo Institute of Industrial Intelligence (Qingdao) Co., Ltd., Cosmoplat Iot Technology Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Deyan Liu. Retrieved from https://idiyas.com/inventor/deyan-liu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Deyan Liu - Innovator in Data Processing Technology

Introduction

Deyan Liu is an inventor based in Qingdao, China. He specializes in data processing technology, focusing on optimizing process parameters in manufacturing equipment. His innovative approach aims to enhance efficiency and accuracy in manufacturing processes.

Latest Patent Applications

Deyan Liu has submitted a patent application titled "METHOD, APPARATUS AND DEVICE FOR OPTIMIZING PROCESS PARAMETER, AND STORAGE MEDIUM." This application pertains to a method, apparatus, and device for optimizing a process parameter and a storage medium. The process involves using a first weight parameter of a pre-trained support vector regression model as an iterative initial value. It calculates a second weight parameter using an online proximal gradient algorithm based on training data. The optimized support vector regression model is obtained by updating the first weight parameter to the second weight parameter. The model then processes a first process parameter to yield a first detection parameter output, which is used to calculate a target process parameter for the manufacturing equipment.

Conclusion

Deyan Liu's contributions to data processing technology reflect his commitment to innovation in optimizing manufacturing processes. His work has the potential to significantly impact the efficiency of manufacturing operations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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