Munich, Germany

Detlef Schupp

This inventor holds 1 USPTO granted patent. Top assignee: Kla-Tencor Mie Gmbh. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Detlef Schupp. Retrieved from https://idiyas.com/inventor/detlef-schupp-ppw54fqb

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Detlef Schupp: Innovator in Automatic Defect Classification

Introduction

Detlef Schupp is a notable inventor based in Munich, Germany. He has made significant contributions to the field of automatic defect classification through his innovative methods. His work has implications for various industries that rely on quality control and defect detection.

Latest Patents

Detlef Schupp holds a patent for a "Method of learning a knowledge-based database used in automatic defect classification." This invention relates to a method that allows the system to operate in an automatic learning mode, significantly reducing the number of user entries required. This advancement not only streamlines the process but also enhances the efficiency of defect classification.

Career Highlights

Detlef Schupp is associated with Kla-Tencor Mie GmbH, a company known for its expertise in advanced semiconductor process control. His role at the company has allowed him to apply his innovative ideas in practical settings, contributing to the development of cutting-edge technologies.

Collaborations

Detlef has worked alongside talented individuals such as Dirk Soenksen and Thin Van Luu. Their collaborative efforts have fostered an environment of innovation and creativity, leading to advancements in their respective fields.

Conclusion

Detlef Schupp's contributions to automatic defect classification exemplify the impact of innovative thinking in technology. His patent and work at Kla-Tencor Mie GmbH highlight the importance of efficiency and accuracy in quality control processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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