Kfar Harif, Israel

Deny Hanan

This inventor holds 1 USPTO granted patent. Top assignee: Sandisk Technologies Inc.. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Deny Hanan. Retrieved from https://idiyas.com/inventor/deny-hanan-bjm6a6ze

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Unveiling the Innovations of Deny Hanan in Semiconductor Devices

Introduction: Deny Hanan, a talented inventor hailing from Kfar Harif, IL, has made significant contributions to the field of semiconductor devices with his cutting-edge creations.

Latest Patents: Deny Hanan has successfully patented the revolutionary "Tj temperature calibration, measurement and control of semiconductor devices" technology. This innovation involves embedded temperature sensors in a semiconductor die to scan the junction temperature, allowing for precise monitoring while the device is operational. This patent showcases his expertise in enhancing performance and reliability in semiconductor technology.

Career Highlights: Deny Hanan is a valued member of Sandisk Technologies Inc., a leading player in the tech industry. His innovative spirit and dedication have led to the development of groundbreaking solutions that push the boundaries of semiconductor capabilities.

Collaborations: In his journey of innovation, Deny Hanan has collaborated with skilled professionals like Eddie Redmard and Itai Dror. Together, they have synergized their expertise to drive technological advancements and achieve remarkable results in the semiconductor sector.

Conclusion: Deny Hanan's relentless pursuit of excellence in semiconductor technology has established him as a trailblazer in the field. His groundbreaking inventions continue to shape the future of semiconductor devices, inspiring others in the industry to reach new heights of innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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