Singapore, Singapore

Dennis Tan

This inventor holds 2 USPTO granted patents. Top assignee: Chartered Semiconductor Manufacturing Ltd (Corporation). Active years: 2007-2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dennis Tan. Retrieved from https://idiyas.com/inventor/dennis-tan-bi9i4fsu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 85(Granted Patents)


Company Filing History:


Years Active: 2007-2011

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2 patents (USPTO):Explore Patents

Title: Dennis Tan - Innovator in Integrated Circuit Testing

Introduction

Dennis Tan is a notable inventor based in Singapore, SG. He has made significant contributions to the field of integrated circuit testing, holding two patents that showcase his innovative approach to technology.

Latest Patents

Tan's latest patents include a planar voltage contrast test structure and method. This invention involves an integrated circuit that features a test structure with a ground grid, a metal pad with a space, and a metal line connected to the ground grid. The design aims to enhance the detection of open circuits and short circuits, providing a more efficient testing method for integrated circuits.

Career Highlights

Dennis Tan is associated with Chartered Semiconductor Manufacturing Ltd, a corporation known for its advancements in semiconductor technology. His work has been instrumental in improving testing methodologies within the industry.

Collaborations

Tan has collaborated with notable coworkers, including Seng-Keong Victor Lim and Tze Ho Simon Chan. Their combined expertise contributes to the innovative environment at Chartered Semiconductor Manufacturing Ltd.

Conclusion

Dennis Tan's contributions to integrated circuit testing through his patents reflect his commitment to innovation in the semiconductor industry. His work continues to influence advancements in technology and testing methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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