Aichtal, Germany

Dennis Odukwe

This inventor holds 1 USPTO granted patent and 2 published patent applications and 2 EPO patents. Top assignee: Putzmeister Engineering Gmbh. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dennis Odukwe. Retrieved from https://idiyas.com/inventor/dennis-odukwe

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Dennis Odukwe and Stability Monitoring for Thick Matter Conveying Systems.

Introduction

Dennis Odukwe is an inventor associated with Aichtal, Germany, and Putzmeister Engineering GmbH. His patent work addresses stability monitoring for thick matter conveying systems, which use pumps and distributing masts to deliver materials.

Latest Patents

Odukwe is associated with 1 patent: “Stability monitoring function for a thick matter conveying system.” The invention describes a system that uses sensors to detect operating information, including the positions of the mast’s rotary mechanism, mast arms, and support legs, as well as the system’s inclination angle. A processing unit uses this information to determine a stability parameter, helping monitor the system during operation.

Career Highlights

Odukwe’s listed patent reflects work on monitoring the stability of complex conveying equipment. The invention combines sensor data from the pump’s supporting structure and distributing mast to assess the system’s operating condition.

Collaborations

Odukwe is associated with Putzmeister Engineering GmbH. Ansgar Müller is identified as a coworker.

Conclusion

Dennis Odukwe’s patent focuses on using sensor information to determine stability in thick matter conveying systems, connecting his inventive work with equipment engineering at Putzmeister Engineering GmbH.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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