Dennis McCarty

Title: Dennis McCarty: Innovator in Charged Particle Beam Systems

Introduction

Dennis McCarty is a notable inventor based in Fremont, CA (US). He has made significant contributions to the field of charged particle beam systems. His innovative work has led to the development of a patented technology that enhances the scanning control of these systems.

Latest Patents

Dennis McCarty holds a patent for "Enhanced scanning control of charged particle beam systems." This invention involves a charged particle beam system capable of imaging and potentially editing a device under test (DUT). The system includes a charged particle beam generation unit, such as a focused ion beam (FIB) column, which emits a charged particle beam onto the DUT. The patent also describes a scan controller arrangement that implements a finite state machine to control the application of the charged particle beam according to various scanning control parameters. These parameters can define rectangular scan regions or other shapes through a bit-map. The method for controlling the scanning of a charged particle beam involves obtaining a set of scanning control parameters and directing the beam as specified.

Career Highlights

Dennis McCarty has had a successful career in the field of charged particle beam technology. He is currently associated with Credence Systems Corporation, where he continues to innovate and develop advanced technologies. His work has been instrumental in enhancing the capabilities of charged particle beam systems.

Collaborations

Some of Dennis McCarty's coworkers include James Siebert and Lokesh Johri. Their collaboration has contributed to the advancement of technologies in their field.

Conclusion

Dennis McCarty is a prominent inventor whose work in charged particle beam systems has led to significant advancements in imaging and editing technologies. His contributions continue to impact the industry positively.