Greencastle, PA, United States of America

Dennis K Mc Creary

This inventor holds 1 USPTO granted patent. Top assignee: Alltech Associates, Inc.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dennis K Mc Creary. Retrieved from https://idiyas.com/inventor/dennis-k-mc-creary

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 10.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2012

Loading Chart...
1 patent (USPTO):Explore Patents

Title: The Innovations of Dennis K. McCreary

Introduction

Dennis K. McCreary is an accomplished inventor based in Greencastle, PA (US). He has made significant contributions to the field of sample analysis through his innovative methods and apparatus. His work has been recognized in the form of a patent, showcasing his expertise and dedication to advancing technology.

Latest Patents

Dennis holds a patent for "Methods and apparatus for analyzing samples and collecting sample fractions." This patent details methods and apparatus for analyzing a sample using at least one detector, which is crucial for various applications in research and industry.

Career Highlights

Dennis is currently employed at Alltech Associates, Inc., where he continues to apply his knowledge and skills in the field of sample analysis. His work at the company has allowed him to further develop his innovative ideas and contribute to the advancement of technology.

Collaborations

Throughout his career, Dennis has collaborated with notable colleagues, including James M. Anderson, Jr. and Raaidah Saari-Nordhaus. These collaborations have enriched his work and fostered a creative environment for innovation.

Conclusion

Dennis K. McCreary is a notable inventor whose contributions to sample analysis have made a significant impact in his field. His patent and work at Alltech Associates, Inc. reflect his commitment to innovation and excellence.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…