The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8115930 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 14, 2012

Filed:

Dec. 04, 2008
Applicants:

James M. Anderson, Jr., Arlington Heights, IL (US);

Raaidah B. Saari-nordhaus, Antioch, IL (US);

Washington J. Mendoza, Lake in the Hills, IL (US);

Josef P. Bystron, Chicago, IL (US);

Dirk Helgemo, Shakopee, MN (US);

Sheldon Nelson, Plymouth, MN (US);

Bruce D. Black, Napa, CA (US);

Neil R. Picha, Petaluma, CA (US);

Dennis K. MC Creary, Greencastle, PA (US);

Carl H. Poppe, Sabastopol, CA (US);

Inventors:

James M. Anderson, Jr., Arlington Heights, IL (US);

Raaidah B. Saari-Nordhaus, Antioch, IL (US);

Washington J. Mendoza, Lake in the Hills, IL (US);

Josef P. Bystron, Chicago, IL (US);

Dirk Helgemo, Shakopee, MN (US);

Sheldon Nelson, Plymouth, MN (US);

Bruce D. Black, Napa, CA (US);

Neil R. Picha, Petaluma, CA (US);

Dennis K. Mc Creary, Greencastle, PA (US);

Carl H. Poppe, Sabastopol, CA (US);

Assignee:

Alltech Associates, Inc., Columbia, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and apparatus for analyzing a sample using at least one detector are disclosed.


Find Patent Forward Citations

Anderson, Jr., James. (2012). Methods and apparatus for analyzing samples and collecting sample fractions (U.S. Patent No. 8115930). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8115930

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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