Denis Suhanov

Title: Innovations of Denis Suhanov

Introduction

Denis Suhanov is a notable inventor based in Ashdod, Israel. He has made significant contributions to the field of semiconductor examination and defect detection through his innovative methods. With a total of two patents to his name, Suhanov's work exemplifies the intersection of deep learning and semiconductor technology.

Latest Patents

Suhanov's latest patents include a "Method of deep learning-based examination of a semiconductor specimen and system thereof." This method utilizes a trained Deep Neural Network (DNN) to process fabrication process samples, incorporating images from multiple examination modalities. The DNN processes these images separately and combines the results to generate examination-related data specific to the application. Another significant patent is for "Machine learning-based defect detection of a specimen." This method involves obtaining a runtime image of a specimen and processing it using both supervised and unsupervised models to detect defects, ultimately combining the outputs for a comprehensive defect detection result.

Career Highlights

Denis Suhanov has worked with prominent companies in the semiconductor industry, including Applied Materials Israel Limited. His experience in these organizations has allowed him to refine his skills and contribute to groundbreaking advancements in technology.

Collaborations

Suhanov has collaborated with notable professionals in his field, including Boaz Cohen and Ohad Shaubi. These collaborations have further enriched his work and expanded the impact of his innovations.

Conclusion

Denis Suhanov's contributions to semiconductor examination and defect detection through his innovative patents highlight his expertise and commitment to advancing technology. His work continues to influence the industry and pave the way for future innovations.