SHENZHEN, China

Dejin Zheng

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Orbbec Inc.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dejin Zheng. Retrieved from https://idiyas.com/inventor/dejin-zheng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Dejin Zheng: Innovator in Optical Axis Calibration

Introduction

Dejin Zheng is a notable inventor based in Shenzhen, China. He has made significant contributions to the field of optical axis detection systems. His innovative approach has led to advancements in calibration methods that enhance accuracy and efficiency.

Latest Patents

Dejin Zheng holds a patent for an "Optical axis calibration method and apparatus of optical axis detection system, terminal, system, and medium." This method involves acquiring speckle images before and after the rotation of a speckle emission device. It includes extracting speckle points from these images to form line segments and calculating perpendicular bisectors to determine an optical axis reference point. This technique effectively reduces the impact of jig tolerance on optical axis calibration, thereby improving accuracy.

Career Highlights

Dejin Zheng is currently employed at Orbbec Inc., where he continues to develop innovative solutions in optical technology. His work has been instrumental in advancing the capabilities of optical detection systems.

Collaborations

Dejin collaborates with talented coworkers, including Yanxu Duan and Wanduo Wu, who contribute to the innovative environment at Orbbec Inc.

Conclusion

Dejin Zheng's contributions to optical axis calibration demonstrate his commitment to innovation and excellence in technology. His work not only enhances the accuracy of optical systems but also sets a foundation for future advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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