The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2025
Filed:
Jul. 03, 2023
Orbbec Inc., Guangdong, CN;
Orbbec Inc., Shenzhen, CN;
Abstract
A method for calibrating an optical axis includes: acquiring a first speckle image and a second speckle image captured respectively before and after a speckle emission device is rotated; extracting at least two first speckle points in the first speckle image and second speckle points in the second speckle image corresponding to the at least two first speckle points, to obtain at least two line segments formed by lines connecting the first speckle points and the second speckle points corresponding to the first speckle points in the same image coordinate system; and calculating a perpendicular bisector of each of the line segments, and determining an optical axis reference point according to an intersection point of the perpendicular bisectors. The method provided in embodiments of this application can reduce the impact of a jig tolerance on the optical axis calibration, and improve the accuracy of the optical axis calibration.