Debra M Yung

Title: Debra M Yung - Innovator in Semiconductor Processing

Introduction

Debra M Yung is a prominent inventor based in San Jose, CA (US). She has made significant contributions to the field of semiconductor processing, particularly through her innovative patent that enhances the efficiency of focused ion beam (FIB) operations.

Latest Patents

Debra holds a patent titled "Automatic sequencing of FIB operations." This patent describes a method for processing semiconductor devices by applying a focused ion beam to a structure. The process involves producing a live detector signal by detecting secondary electrons emitted during the application of the focused ion beam. The live detector signal is then compared with a reference trace that indicates an expected material boundary and a stop marker. This innovative approach allows for the automatic termination or alteration of FIB operations based on real-time comparisons, significantly improving the precision and control in semiconductor manufacturing.

Career Highlights

Debra M Yung is currently employed at Schlumberger Technologies, Inc., where she continues to advance her research and development efforts in semiconductor technology. Her work has been instrumental in enhancing the capabilities of FIB operations, making her a valuable asset to her company and the industry.

Collaborations

Throughout her career, Debra has collaborated with notable colleagues, including David M Keckley and Roger A Nicholson. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Debra M Yung's contributions to semiconductor processing through her patent demonstrate her expertise and commitment to innovation in the field. Her work not only advances technology but also sets a standard for future developments in semiconductor manufacturing.