Company Filing History:
Years Active: 2016-2022
Title: De-Jian Liu: Innovator in High-Density Probing Techniques
Introduction
De-Jian Liu is a prominent inventor based in Jhubei, Taiwan. He has made significant contributions to the field of testing apparatuses, particularly in high-density probing techniques. With a total of 4 patents to his name, Liu continues to push the boundaries of innovation in his industry.
Latest Patents
One of Liu's latest patents focuses on devices for high-density probing techniques and methods of implementing the same. This patent describes a testing apparatus designed to reduce warping of the probe card. The apparatus includes a testing head and a platform that move relative to one another, allowing a sample to come into contact with the probing tips. The testing head comprises a probe card printed circuit board, a stiffener, a discontinuous backer, and multiple probing tips. The stiffener reinforces the probe card, while the discontinuous backer extends from the probe card to the stiffener, featuring at least one unfilled void. This innovative design aims to enhance the performance and reliability of testing apparatuses.
Career Highlights
De-Jian Liu is currently employed at Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His work has been instrumental in advancing testing technologies that are crucial for semiconductor manufacturing. Liu's expertise and innovative mindset have positioned him as a key player in his field.
Collaborations
Liu has collaborated with notable colleagues, including Mill-Jer Wang and Ching-Nen Peng. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and advancements in technology.
Conclusion
De-Jian Liu's contributions to high-density probing techniques exemplify his commitment to innovation in the semiconductor industry. His patents and collaborative efforts continue to shape the future of testing apparatuses, making a lasting impact on technology.