This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Dayun Lee: Inventor in Image Sensor Testing
Introduction
Dayun Lee is an inventor based in Suwon, South Korea, and works at Samsung Electronics Co., Ltd. His patent work includes a machine-learning-based approach to determining whether an image sensor is defective.
Latest Patents
Lee is associated with 1 patent, titled “Test Device and Operating Method Thereof.” The invention describes a test device that preprocesses a raw image from an image sensor to generate a test image. A first deep learning neural network classifies the test image’s pattern using a dataset containing examples of defect patterns and normal images. Based on the classification, the device determines whether the image sensor is defective.
Career Highlights
Lee’s listed patent focuses on applying deep learning to image sensor testing. The method uses pattern classification to distinguish potential defects from normal image output.
Collaborations
Lee’s listed coworker is Yubin Lee. The patent information provided does not specify their respective roles or the nature of their collaboration.
Conclusion
Dayun Lee’s patent describes a deep learning-based system for identifying defective image sensors, reflecting his work in image testing technology at Samsung Electronics.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile