The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2026
Filed:
Aug. 15, 2024
Samsung Electronics Co., Ltd., Suwon-si, KR;
Yubin Lee, Suwon-si, KR;
Dayun Lee, Suwon-si, KR;
Kundong Kim, Suwon-si, KR;
Yongkoo Park, Suwon-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
A system for testing whether or not an image sensor included in an image frame is defective includes including a processor configured to execute machine-readable instructions that, when executed by the processor, cause the test device to generate a test image by performing one or more preprocessing operations on a raw image output from an image sensor, and to classify an image pattern of the test image as any one of patterns included in a first data set by using a first deep learning neural network trained based on the first data set and to determine, based on a classifying result, whether or not the image sensor is defective. The first data set comprises a data set for each pattern, classified to correspond to each of one or more defect patterns and to a normal pattern of an image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile