Company Filing History:
Years Active: 1998
Title: The Innovative Contributions of David Zaterka in Semiconductor Technology
Introduction
David Zaterka is a prominent inventor based in Durham, NC, who has made significant contributions to the field of semiconductor technology. With a total of three patents to his name, Zaterka's work focuses on enhancing the performance and efficiency of field effect transistors.
Latest Patents
One of Zaterka's latest patents is for an **Asymmetrical Vertical Lightly Doped Drain Transistor**. This innovative device is formed on a semiconductor substrate featuring distinct planar surfaces, one of which is positioned lower than the other. The design allows for unique contours of ion concentration in the drain region, promoting enhanced performance characteristics. Another noteworthy patent focuses on a **Field Effect Transistor with an Arched Gate and its Manufacturing Method**. This invention employs an arched gate MOSFET structure, where the gate conforms to the substrate's surface, thereby optimizing the channel's shape and improving transistor efficiency.
Career Highlights
David Zaterka is currently employed at Mitsubishi Semiconductor America, Inc., where he continues to push the boundaries of semiconductor innovation. His work at the company reflects a commitment to developing cutting-edge technologies that have substantial implications in the electronics industry.
Collaborations
Throughout his career, Zaterka has collaborated with fellow inventors J. Neil Schunke and Thomas S. Taylor. These collaborations have resulted in groundbreaking advancements and further exploration of semiconductor devices, showcasing the synergy between talented professionals in this field.
Conclusion
David Zaterka’s innovative spirit and dedication to semiconductor technology underscore his significance as an inventor. His contributions, particularly through his recent patents, continue to influence the landscape of field effect transistors, paving the way for future advancements in electronic devices.