David Williams

Title: David Williams - Innovator in Surface Measurement Technology

Introduction

David Williams is an accomplished inventor based in Westampton, NJ (US). He has made significant contributions to the field of color measurement technology. His innovative approach has led to the development of a unique method for measuring surface gloss and spectral reflectance.

Latest Patents

David holds a patent for a "Method and apparatus for measuring surface gloss and spectral reflectance." This method involves controlling a gloss channel of a color measurement apparatus to measure the surface gloss of a color sample, generating a gloss value. Additionally, it includes controlling a color channel to measure a reflectance spectrum of the color sample, resulting in a first plurality of reflectance values under a specific measurement geometry. These values are then converted to represent the reflectance spectrum under a different measurement geometry, utilizing an adjustment based on the gloss value. This innovative method enhances the accuracy and efficiency of color measurement.

Career Highlights

David is currently employed at Datacolor Inc., where he continues to advance his research and development efforts. His work has been instrumental in improving color measurement technologies, making them more reliable and effective for various applications.

Collaborations

David collaborates with talented professionals in his field, including Zhiling Xu and Nilesh B Dhote. Their combined expertise fosters innovation and drives advancements in color measurement technology.

Conclusion

David Williams is a notable inventor whose work in surface measurement technology has made a significant impact. His patent and ongoing contributions at Datacolor Inc. highlight his dedication to innovation in the field.