The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Sep. 13, 2022
Applicant:

Datacolor, Inc., Lawrenceville, NJ (US);

Inventors:

Zhiling Xu, Princeton Junction, NJ (US);

Nilesh B. Dhote, Ewing, NJ (US);

David Williams, Westampton, NJ (US);

Seaver Li, Belle Mead, NJ (US);

William Binder, Lakeville, PA (US);

Venkata R. Thumu, Pennington, NJ (US);

Assignee:

Datacolor, Inc., Lawrenceville, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/57 (2006.01); G01N 21/25 (2006.01);
U.S. Cl.
CPC ...
G01N 21/57 (2013.01); G01N 21/251 (2013.01); G01N 2201/062 (2013.01); G01N 2201/127 (2013.01);
Abstract

A method includes controlling a gloss channel of a color measurement apparatus to measure a surface gloss of a color sample to generate a gloss value for the color sample. A color channel of the color measurement apparatus is controlled to measure a reflectance spectrum of the color sample to generate a first plurality of reflectance values for the color sample under a first measurement geometry. The first plurality of reflectance values are converted to a second plurality of reflectance values representing the reflectance spectrum of the color sample under a second measurement geometry, different from the first measurement geometry. The converting utilizes an adjustment that is a function of the gloss value.


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