David W Hatch

Title: The Innovations of David W. Hatch

Introduction

David W. Hatch is an accomplished inventor based in Hudson, Massachusetts. He has made significant contributions to the field of quality control through his innovative patent. His work focuses on improving the accuracy and efficiency of statistical analysis in quality control data.

Latest Patents

David W. Hatch holds a patent for a "System for statistical analysis of quality control data." This statistical database system enhances error checking of quality control data used to measure the performance of quantitative analysis equipment. The system allows for flexible data delivery, which can be input via various methods such as scanning, operator keyed summary data, operator keyed raw data, analyzer direct download, and Internet-delivered data. The quality control data is verified against specific lot and analyzer parameters, ensuring that any data falling outside of these specified ranges can be excluded from a peer group. This innovative approach allows for real-time processing of quality control data, making reports viewable in real time.

Career Highlights

David W. Hatch is currently employed at Bionostics, Inc., where he continues to develop and refine his innovative ideas. His work has had a significant impact on the field of quality control, particularly in the realm of statistical analysis.

Collaborations

David has collaborated with notable coworkers, including Jeffrey A. Jones and Nancy D. Hallock, who have contributed to his projects and innovations.

Conclusion

David W. Hatch's contributions to the field of quality control through his innovative patent demonstrate his commitment to improving statistical analysis methods. His work continues to influence the industry and enhance the accuracy of quality control data.