The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2006
Filed:
Feb. 26, 2001
Jeffrey A. Jones, Plaistow, NH (US);
David W. Hatch, Hudson, MA (US);
Nancy D. Hallock, Pittsford, CA (US);
Sundar Balasuryan, Lexington, MA (US);
Jeffrey A. Jones, Plaistow, NH (US);
David W. Hatch, Hudson, MA (US);
Nancy D. Hallock, Pittsford, CA (US);
Sundar Balasuryan, Lexington, MA (US);
Bionostics, Inc., Devens, MA (US);
Abstract
A statistical database system can improve error checking of quality control data used to measure the performance of quantitative analysis equipment. The quality control data can be delivered to a centralized database, wherein the database is linked to error checking functions. Data delivery can be flexible, allowing input via scanning, operator keyed summary data, operator keyed raw data, analyzer direct download, Internet-delivered summary data and Internet-delivered raw data. The received quality control data can be verified against specific lot and analyzer parameters, and data falling outside of these specified ranges can be excluded from a peer group. Excluded data can be verified against original submitted data, and excluded data can then appear on final reports. The quality control data can also be entered directly into the database and a peer group report can then be generated. The quality control data is processed in real time with the data entry and the reports are viewable in real time.