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For the Inventor, By the Inventor

Loveland, CO, United States of America

David T Crook

This inventor holds 21 USPTO granted patents and 1 EPO patent, primarily in Electrical Testing. Top assignees: Hewlett-Packard Company, Agilent Technologies, Inc., Hach Company. Active years: 1989-2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David T Crook. Retrieved from https://idiyas.com/inventor/david-t-crook

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 21

% Patents Active = 76.2

 

Average Co-Inventor Count = 2.5

ph-index = 10

Forward Citations = 488(Granted Patents)


Company Filing History:

goldMedal10 out of 9,639 
 
Hewlett-Packard Company
 patents
silverMedal9 out of 4,738 
 
Agilent Technologies, Inc.
 patents
bronzeMedal2 out of 233 
 
Hach Company
 patents

Years Active: 1989-2018

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Areas of Expertise:
Measurement System
Capacitive Probe
In-Circuit Testing
Electrical Contact Integrity
Magnetic Test
Fault Identification
Robotic Positioning
Analog Communication
Test Measurement
Program Generation
Test Delay Learning
Solder Joint Detection
21 patents (USPTO):Explore Patents
1. 10006863 - Adjustment of measurement system components (2018-06-26),
2. 9329054 - Adjustment of measurement system components (2016-05-03),
3. 7492170 - Probe based information storage for probes used for opens detection in in-circuit testing (2009-02-17),
4. 7109728 - Probe based information storage for probes used for opens detection in in-circuit testing (2006-09-19),
5. 6930494 - Capacitive probe assembly with flex circuit (2005-08-16),
6. 6901336 - Method and apparatus for supplying power, and channeling analog measurement and communication signals over single pair of wires (2005-05-31),
7. 6876214 - Method and apparatus for configurable hardware augmented program generation (2005-04-05),
8. 6636061 - Method and apparatus for configurable hardware augmented program generation (2003-10-21),
9. 6529019 - Multiple axis magnetic test for open integrated circuit pins (2003-03-04),
10. 6377901 - Method and apparatus for adaptively learning test measurement delays on an individual device test for reducing total device test time (2002-04-23),
11. 6324486 - Method and apparatus for adaptively learning test error sources to reduce the total number of test measurements required in real-time (2001-11-27),
12. 5696451 - Identification of pin-open faults by capacitive coupling (1997-12-09),
13. 5625292 - System for measuring the integrity of an electrical contact (1997-04-29),
14. 5557209 - Identification of pin-open faults by capacitive coupling through the (1996-09-17),
15. 5498964 - Capacitive electrode system for detecting open solder joints in printed (1996-03-12),

Title: The Innovative Journey of David T Crook

Introduction: David T Crook is a renowned inventor based in Loveland, Colorado, known for his groundbreaking contributions to various industries.

Latest Patents: David T Crook holds several patents in the fields of technology, healthcare, and consumer products, showcasing his diverse range of innovative ideas.

Career Highlights: With a career spanning over two decades, David T Crook has established himself as a visionary inventor with a keen eye for identifying gaps in the market and developing unique solutions to address them.

Collaborations: Throughout his career, David T Crook has collaborated with leading companies, research institutions, and universities to bring his inventions to life, demonstrating his ability to work effectively in multidisciplinary teams.

Conclusion: David T Crook's passion for innovation and his relentless pursuit of excellence have solidified his reputation as a pioneering inventor in the world of technology and beyond.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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