This inventor holds 2 USPTO granted patents and 1 published patent application and 1 EPO patent. Top assignee: Zygo Corporation. Active years: 2000-2003.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2000-2003
Title: David Stephenson: Innovator in Interferometric Technology
Introduction
David Stephenson is a notable inventor based in Madison, Connecticut. He has made significant contributions to the field of interferometry, holding 2 patents that focus on reducing coherent artifacts in interferometric systems. His work has implications for enhancing the accuracy and reliability of measurements in various scientific applications.
Latest Patents
Stephenson's latest patents include an "Apparatus and method(s) for reducing the effects of coherent artifacts in an interferometer" and "Geometrically-desensitized interferometer incorporating an optical assembly." The first patent addresses the preservation of fringe contrast in interferograms while suppressing unwanted coherent artifacts. This is achieved through innovative illumination and imaging architectures that generate and combine individual interferograms from different off-axis locations. The second patent focuses on optimizing stray beam deviation and suppression in a GDI instrument's optical assembly, enhancing the overall performance of the device.
Career Highlights
Throughout his career, David Stephenson has worked with prominent companies such as Zygo Corporation and Kuchel, Michael. His experience in these organizations has allowed him to refine his expertise in optical technologies and interferometric systems.
Collaborations
Stephenson has collaborated with notable colleagues, including Xavier Colonna De Lega and Leslie Ludwig Deck. These partnerships have contributed to the advancement of his research and innovations in the field.
Conclusion
David Stephenson's contributions to interferometric technology through his patents and collaborations highlight his role as a significant innovator in the field. His work continues to influence advancements in optical measurement systems.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
