Company Filing History:
Years Active: 2006-2016
Title: David Schiener: Innovator in Optical Measurement Techniques
Introduction
David Schiener is a notable inventor based in Ganei Yehuda, Israel. He has made significant contributions to the field of optical measurement, holding a total of 6 patents. His work focuses on innovative techniques that enhance the manufacturing processes of multi-layer samples.
Latest Patents
One of Schiener's latest patents involves a method for lateral shift measurement using an optical technique. This invention addresses the alignment of layers during the manufacture of multi-layer samples by applying optical measurements to a specific measurement site within the sample. The measurement site consists of two diffractive structures positioned one above the other in different layers. The optical measurements include at least two assessments with varying polarization states of incident light. Each measurement illuminates the site to allow one diffractive structure to be viewed through the other. The diffraction properties observed at the measurement site indicate any lateral shift between the diffractive structures. By analyzing these properties for the different polarization states, Schiener’s technique determines the existing lateral shift between the layers.
Career Highlights
David Schiener is currently employed at Nova Measuring Instruments Ltd., where he continues to develop and refine his innovative optical measurement techniques. His work has been instrumental in advancing the capabilities of optical measurements in manufacturing.
Collaborations
Some of Schiener's coworkers include Boaz Brill and Moshe Finarov, who contribute to the collaborative environment at Nova Measuring Instruments Ltd.
Conclusion
David Schiener is a prominent inventor whose work in optical measurement techniques has significantly impacted the manufacturing industry. His innovative patents reflect his dedication to advancing technology in this field.