David S Ho

Title: Innovations by David S. Ho

Introduction

David S. Ho is a notable inventor based in Garland, TX (US). He has made significant contributions to the field of technology, particularly in the area of VLSI processors and imaging systems. With a total of 2 patents, his work reflects a commitment to advancing engineering solutions.

Latest Patents

One of his latest patents is titled "Architecture and method for testing VLSI processors." This invention involves a method and apparatus for testing VLSI processors using a bit-sliced bus-oriented data path. It includes data and control monitors, as well as Built-In Test (BIT) for the on-chip memory. The data monitor compresses output data produced by the data path, while the BIT implementation of a functional test, coupled with the data monitor, is used for an off-line self-test of the data path in the field. The control monitor decouples the testing task of the control section from that of the data path.

Another significant patent is the "CCD Imager," which features an adaptive threshold circuit. This invention compensates for variations in illumination across the document being read by the imager, ensuring an accurate digital representation of the image on the document.

Career Highlights

David S. Ho is currently employed at Texas Instruments Corporation, a leading company in the semiconductor industry. His work at Texas Instruments has allowed him to develop innovative technologies that enhance the performance and reliability of electronic devices.

Collaborations

Throughout his career, David has collaborated with talented individuals such as Satish M. Thatte and Thirumalai Sridhar. These collaborations have contributed to the successful development of his patented technologies.

Conclusion

David S. Ho's contributions to the fields of VLSI processors and imaging systems demonstrate his innovative spirit and technical expertise. His patents reflect a dedication to improving technology and enhancing the functionality of electronic devices.