The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 1986
Filed:
Nov. 14, 1983
Applicant:
Inventors:
Satish M Thatte, Richardson, TX (US);
Thirumalai Sridhar, Dallas, TX (US);
David S Ho, Garland, TX (US);
Han-Tzong Yuan, Dallas, TX (US);
Theo J Powell, Dallas, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
371 25 ; 324 / ;
Abstract
A method and apparatus for testing VLSI processors using a bit-sliced bus-oriented data path include data and control monitors and BIT for the on-chip memory. The data monitor is used to compress output data produced by the data path. BIT implementation of a functional test coupled with the data monitor are used for an off-line self-test of the data path in field. The control monitor is used to decouple the testing task of the control section from that of the data path.