Texas Instruments Corporation

David S Ho

Han-Tzong Yuan

Theo J Powell

Satish M Thatte

William C Choate

Thirumalai Sridhar

A method and apparatus for testing VLSI processors using a bit-sliced bus-oriented data path include data and control monitors and BIT for the on-chip memory. The data monitor is used to compress output data produced by the data path. BIT implementation of a functional test coupled with the data monitor are used for an off-line self-test of the data path in field. The control monitor is used to decouple the testing task of the control section from that of the data path.

Architecture and method for testing VLSI processors

A CCD imager is provided with an adaptive threshold circuit. The variations in the illumination across the document being read by the imager are compensated for by the adaptive threshold circuit to accurately provide an accurate digital representation of the image on the document.

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Garland, TX, United States of America

David S Ho